产品细节说明:VMIVME1150 GE 64 位光学耦合数字输入板
- 64个光学耦合数字输入,提供高隔离和抗噪性。
- 5V至48VDC的宽输入电压范围。
- 高隔离性,具有1000V的持续隔离电压和7500V的脉冲隔离电压。
- 可选择的输入滤波选项,标准时间常数为2μs、10μs或5ms。
- 双I/O连接器设计,方便与外部设备连接。
- 支持电压源或电流吸收输入选项以及正或负真输入选项。
- 8或16位数据传输能力。
- 非特权或监督I/O访问权限。
- 高可靠性的DIN兼容输入连接器
产品详情参数 :VMIVME1150 GE 64 位光学耦合数字输入板
- 标准VME双高Eurocard尺寸,160 x 233.5 mm。
- 操作温度范围0至+55°C,存储温度范围-40至+85°C。
- 湿度20至80%,非凝结。
- 典型功率需求为+5VDC,1.1A(典型),最大2.2A。
- 高MTBF(平均故障间隔时间)为139,706小时(217F)。
VMIVME1150 GE 应用领域:
适用于工业自动化、测试测量、过程控制、机器视觉等多种应用场景,提供模拟量I/O接口,方便采集和控制模拟量信号 。广泛应用于工业控制、加工制造、测试测量、自动化装配、机器视觉等领域
Product details: VMIVME1150 GE 64 bit optical coupled digital input board
64 optically coupled digital inputs provide high isolation and noise resistance.
Wide input voltage range from 5V to 48VDC.
High isolation, with a continuous isolation voltage of 1000V and a pulse isolation voltage of 7500V.
Optional input filtering options, with standard time constants of 2 μ s, 10 μ s, or 5ms.
Dual I/O connector design, convenient for connecting with external devices.
Supports voltage source or current absorption input options as well as positive or negative true input options.
8 or 16 bit data transmission capability.
Non privileged or supervised I/O access permissions.
High reliability DIN compatible input connector
Product details and parameters: VMIVME1150 GE 64 bit optical coupled digital input board
Standard VME dual height Eurocard size, 160 x 233.5 mm.
The operating temperature range is 0 to+55 ° C, and the storage temperature range is -40 to+85 ° C.
Humidity range of 20 to 80%, non condensing.
The typical power demand is+5VDC, 1.1A (typical), and a maximum of 2.2A.
The high MTBF (Mean Time Between Failures) is 139706 hours (217F).
VMIVME1150 GE application areas:
Suitable for various application scenarios such as industrial automation, testing and measurement, process control, machine vision, etc., providing analog I/O interfaces for easy acquisition and control of analog signals. Widely used in industrial control, manufacturing, testing and measurement, automated assembly, machine vision and other fields
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